BS EN IEC 61000-4-6-2023.pdf

BSI Standards PublicationElectromagnetic compatibility(EMC)Part 4-6:Testing and measurement techniques Immunity to conducted disturbances,induced by radio-frequency fieldsBS EN IEC 61000-4-6:2023National forewordThis British Standard is the UK implementation of EN IEC 6100046:2023.It is identical to IEC 6100046:2023.It supersedes BS EN 6100046:2014,which will be withdrawn on 11 July 2026.The UK participation in its preparation was entrusted to Technical Committee GEL/210,EMC Policy committee.A list of organizations represented on this committee can be obtained on request to its committee manager.Contractual and legal considerationsThis publication has been prepared in good faith,however no representation,warranty,assurance or undertaking(express or implied)is or will be made,and no responsibility or liability is or will be accepted by BSI in relation to the adequacy,accuracy,completeness or reasonableness of this publication.All and any such responsibility and liability is expressly disclaimed to the full extent permitted by the law.This publication is provided as is,and is to be used at the recipients own risk.The recipient is advised to consider seeking professional guidance with respect to its use of this publication.This publication is not intended to constitute a contract.Users are responsible for its correct application.The British Standards Institution 2023 Published by BSI Standards Limited 2023ISBN 978 0 539 06076 8ICS 33.100.20Compliance with a British Standard cannot confer immunity from legal obligations.This British Standard was published under the authority of the Standards Policy and Strategy Committee on 31 August 2023.Amendments/corrigenda issued since publicationDateText affectedBRITISH STANDARDBS EN IEC 6100046:2023 EUROPEAN STANDARD NORME EUROPENNE EUROPISCHE NORM EN IEC 61000-4-6 July 2023 ICS 33.100.20 Supersedes EN 61000-4-6:2014;EN 61000-4-6:2014/AC:2015 English Version Electromagnetic compatibility(EMC)-Part 4-6:Testing and measurement techniques-Immunity to conducted disturbances,induced by radio-frequency fields(IEC 61000-4-6:2023)Compatibilit lectromagntique(CEM)-Partie 4-6:Techniques dessai et de mesure-Immunit aux perturbations conduites,induites par les champs aux frquences radiolectriques(IEC 61000-4-6:2023)Elektromagnetische Vertrglichkeit(EMV)-Teil 4-6:Prf-und Messverfahren-Strfestigkeit gegen leitungsgefhrte Strgren,induziert durch hochfrequente Felder(IEC 61000-4-6:2023)This European Standard was approved by CENELEC on 2023-07-11.CENELEC members are bound to comply with the CEN/CENELEC Internal Regulations which stipulate the conditions for giving this European Standard the status of a national standard without any alteration.Up-to-date lists and bibliographical references concerning such national standards may be obtained on application to the CEN-CENELEC Management Centre or to any CENELEC member.This European Standard exists in three official versions(English,French,German).A version in any other language made by translation under the responsibility of a CENELEC member into its own language and notified to the CEN-CENELEC Management Centre has the same status as the official versions.CENELEC members are the national electrotechnical committees of Austria,Belgium,Bulgaria,Croatia,Cyprus,the Czech Republic,Denmark,Estonia,Finland,France,Germany,Greece,Hungary,Iceland,Ireland,Italy,Latvia,Lithuania,Luxembourg,Malta,the Netherlands,Norway,Poland,Portugal,Republic of North Macedonia,Romania,Serbia,Slovakia,Slovenia,Spain,Sweden,Switzerland,Trkiye and the United Kingdom.European Committee for Electrotechnical Standardization Comit Europen de Normalisation Electrotechnique Europisches Komitee fr Elektrotechnische Normung CEN-CENELEC Management Centre:Rue de la Science 23,B-1040 Brussels 2023 CENELEC All rights of exploitation in any form and by any means reserved worldwide for CENELEC Members.Ref.No.EN IEC 61000-4-6:2023 E BS EN IEC 6100046:2023EN IEC 61000-4-6:2023(E)2 European foreword The text of document 77B/863/FDIS,future edition 5 of IEC 61000-4-6,prepared by SC 77B High frequency phenomena of IEC/TC 77 Electromagnetic compatibility was submitted to the IEC-CENELEC parallel vote and approved by CENELEC as EN IEC 61000-4-6:2023.The following dates are fixed:latest date by which the document has to be implemented at national level by publication of an identical national standard or by endorsement(dop)2024-04-11 latest date by which the national standards conflicting with the document have to be withdrawn(dow)2026-07-11 This document supersedes EN 61000-4-6:2014 and all of its amendments and corrigenda(if any).Attention is drawn to the possibility that some of the elements of this document may be the subject of patent rights.CENELEC shall not be held responsible for identifying any or all such patent rights.This document has been prepared under a standardization request addressed to CENELEC by the European Commission.The Standing Committee of the EFTA States subsequently approves these requests for its Member States.Any feedback and questions on this document should be directed to the users national committee.A complete listing of these bodies can be found on the CENELEC website.Endorsement notice The text of the International Standard IEC 61000-4-6:2023 was approved by CENELEC as a European Standard without any modification.In the official version,for Bibliography,the following notes have to be added for the standard indicated:IEC 61000-4-3 NOTE Approved as EN IEC 61000-4-3 CISPR 16-1-4 NOTE Approved as EN IEC 55016-1-4 BS EN IEC 6100046:2023EN IEC 61000-4-6:2023(E)3 Annex ZA(normative)Normative references to international publications with their corresponding European publications The following documents are referred to in the text in such a way that some or all of their content constitutes requirements of this document.For dated references,only the edition cited applies.For undated references,the latest edition of the referenced document(including any amendments)applies.NOTE 1 Where an International Publication has been modified by common modifications,indicated by(mod),the relevant EN/HD applies.NOTE 2 Up-to-date information on the latest versions of the European Standards listed in this annex is available here:www.cencenelec.eu.Publication Year Title EN/HD Year CISPR 16-1-2-Specification for radio disturbance and immunity measuring apparatus and methods-Part 1-2:Radio disturbance and immunity measuring apparatus-Coupling devices for conducted disturbance measurements EN 55016-1-2-BS EN IEC 6100046:2023 2 IEC 61000-4-6:2023 IEC 2023 CONTENTS FOREWORD.6 INTRODUCTION.8 1 Scope.9 2 Normative references.9 3 Terms and definitions.9 4 General.11 5 Test levels.13 6 Test equipment and level adjustment procedure.15 6.1 Test generator.15 6.2 Coupling and decoupling devices.16 6.2.1 General.16 6.2.2 Coupling/decoupling networks(CDNs).18 6.2.3 Clamp injection devices.20 6.2.4 Direct injection devices.22 6.2.5 Decoupling networks.22 6.3 Verification of the common-mode impedance at the EUT port of coupling and decoupling devices.22 6.3.1 General.22 6.3.2 Insertion loss of the 150 to 50 adapters.23 6.4 Setting of the test generator.25 6.4.1 General.25 6.4.2 Setting of the output level at the EUT port of the coupling device.25 7 Test setup and injection methods.27 7.1 Test setup.27 7.2 EUT comprising a single unit.28 7.3 EUT comprising several units.30 7.4 Rules for selecting injection methods and test points.31 7.4.1 General.31 7.4.2 Injection method.31 7.4.3 Ports to be tested.32 7.5 CDN injection application.32 7.6 Clamp injection application.34 7.7 Direct injection application.36 8 Test procedure.36 9 Evaluation of the test results.37 10 Test report.38 Annex A(normative)EM and decoupling clamps.39 A.1 EM clamps.39 A.1.1 General.39 A.1.2 Specification of EM clamps.39 A.2 EM clamp characterization.41 A.2.1 Specification of the clamp test jig.41 A.2.2 Clamp characterization.42 A.3 Decoupling clamp characterization.47 A.3.1 General.47 A.3.2 Specification of decoupling clamps.47 BS EN IEC 6100046:2023IEC 61000-4-6:2023 IEC 2023 3 A.3.3 Impedance.47 A.3.4 Decoupling factor.48 Annex B(informative)Selection criteria for the frequency range of application.50 Annex C(informative)Guidelines for selecting test levels.52 Annex D(informative)Information on coupling and decoupling networks.53 D.1 Basic features of the coupling and decoupling networks.53 D.2 Examples of coupling and decoupling networks.53 Annex E(informative)Information for the test generator specification.58 Annex F(informative)Test setup for large EUTs.59 F.1 General.59 F.2 Test setup for large EUTs.59 Annex G(informative)Measurement uncertainty of the voltage test level.62 G.1 General.62 G.2 General symbols.62 G.3 Uncertainty budgets for test methods.62 G.3.1 Definition of the measurand.62 G.3.2 MU contributors of the measurand.63 G.3.3 Input quantities and calculation examples for expanded uncertainty.64 G.4 Expression of the calculated measurement uncertainty and its application.71 Annex H(informative)Testing with multiple signals.73 H.1 General.73 H.2 Intermodulation.73 H.3 Power requirements.74 H.4 Level-setting requirements.75 H.5 Linearity check and harmonics checks of the test generator.75 H.6 EUT performance criteria with multiple signals.75 Annex I(informative)Port-to-port injection.76 I.1 General.76 I.2 Test setup for injection on identical ports.76 I.2.1 Selection of ports.76 I.2.2 Procedure for port-to-port injection.76 Annex J(informative)Amplifier compression and non-linearity.78 J.1 Objective of limiting amplifier distortion.78 J.2 Possible problems caused by harmonics and saturation.78 J.3 Limiting the harmonic content in the disturbance signal.78 J.4 Effect of linearity characteristic on the immunity test.79 J.4.1 General.79 J.4.2 Evaluation of the amplifier linearity characteristic.79 Bibliography.83 Figure 1 Diagram showing EM fields near the EUT due to common-mode currents on its cables.12 Figure 2 Schematic setup for immunity test to RF conducted disturbances.13 Figure 3 Example of unmodulated and modulated RF signal.14 Figure 4 Test generator setup.16 Figure 5 Principle of coupling and decoupling Symbols used for the indicated setup principles.17 BS EN IEC 6100046:2023 4 IEC 61000-4-6:2023 IEC 2023 Figure 6 Principle of coupling and decoupling Principle of direct injection to screened cables.17 Figure 7 Principle of coupling and decoupling Principle of coupling to unscreened cables according to the CDN method.18 Figure 8 Principle of coupling and decoupling Principle of decoupling.18 Figure 9 Example of circuit for evaluating the transmission loss of the current clamp level-setting.21 Figure 10 Example of circuit for level-setting setup in a 150 test jig.21 Figure 11 Example of the setup geometry to verify the impedance characteristics of the coupling and decoupling devices.23 Figure 12 Setup principle to verify Zce of the coupling and decoupling device.24 Figure 13 Setup principle for measuring the insertion loss of two 150 to 50 adapters.24 Figure 14 Circuit and construction of the 150 to 50 adapter.24 Figure 15 Definition of a common-mode point for unscreened and screened cables.26 Figure 16 Setup for level-setting at the EUT port of the coupling/decoupling devices.27 Figure 17 Example of test setup with a single unit EUT with only one CDN for injection(top view).28 Figure 18 Example of test setup with a single unit EUT(top view)using multiple CDNs.29 Figure 19 Example of a test setup with a multi-unit EUT(top view).30 Figure 20 Rules for selecting the injection method.31 Figure 21 Immunity test for two-port EUT(when only one CDN can be used).34 Figure 22 General principle of a test setup using clamp injection devices.35 Figure 23 Example of the test unit locations on the ground plane when using injection clamps(top view).36 Figure A.1 Example:Construction details of the EM clamp.40 Figure A.2 Example:Concept of the EM clamp.41 Figure A.3 Dimension of a reference plane.42 Figure A.4 Test jig.42 Figure A.5 Test jig with inserted clamp.42 Figure A.6 Impedance/decoupling factor measurement setup.43 Figure A.7 Typical examples for clamp impedance,three typical clamps.45 Figure A.8 Typical examples for decoupling factors,three typical clamps.45 Figure A.9 Normalization setup for coupling factor measurement.46 Figure A.10 S21 coupling factor measurement setup.46 Figure A.11 Typical examples for coupling factor,three typical clamps.47 Figure A.12 Decoupling clamp characterization measurement setup.48 Figure A.13 Typical examples for the decoupling clamp impedance.48 Figure A.14 Typical examples for decoupling factors.49 Figure B.1 Start frequency as function of cable length and equipment size.51 Figure D.1 Example of a simplified diagram for the circuit of CDN-S1 used with screened cables(see 6.2.2.5).54 Figure D.2 Example of simplified diagram for the circuit of CDN-M1,CDN-M2 and CDN-M3 used with unscreened supply(mains)lines(see 6.2.2.2).54 BS EN IEC 6100046:2023IEC 61000-4-6:2023 IEC 2023 5 Figure D.3 Example of a simplified diagram for the circuit of CDN-AF2 used with unscreened unbalanced lines(see 6.2.2.4).55 Figure D.4 Example of a simplified diagram for the circuit of CDN-T2,used with an unscreened balanced pair(see 6.2.2.3).55 Figure D.5 Example of a simplified diagram of the circuit of CDN-T4 used with unscreened balanced pairs(see 6.2.2.3).56 Figure D.6 Example of a simplified diagram of the circuit of CDN AF8 used with unscreened unbalanced lines(see 6.2.2.4).56 Figure D.7 Example of a simplified diagram of the circuit of CDN-T8 used with unscreened balanced pairs(see 6.2.2.3).57 Figure F.1 Example of large EUT test setup with elevated horizontal reference ground plane.60 Figure F.2 Example of large EUT test setup with vertical reference ground plane.61 Figure G.1 Example of influences upon voltage test level using CDN.63 Figure G.2 Example of influences upon voltage test level using EM clamp.63 Figure G.3 Example of influences upon voltage test level using current clamp.63 Figure G.4 Example of influences upon voltage test level using direct injection.64 Figure G.5 Circuit for level-setting setup of CDN.65 Figure H.1 Test frequencies f1 and f2 and intermodulation frequencies of the second and third order.73 Figure I.1 Example of setup,port-to-port injection.77 Figure J.1 Amplifier linearity measurement setup.80 Figure J.2 Linearity characteristic.81 Figure J.3 Measurement setup for modulation depth.81 Figure J.4 Spectrum of AM modulated signal.82 Table 1 Test levels.14 Table 2 Characteristics of the test generator.15 Table 3 Main parameter of the combination of the coupling and decoupling device.16 Table 4 Usage of CDNs.19 Table B.1 Main parameter of the combination of the coupling and decoupling device when the frequency range of the test is extended above 80 MHz.50 Table E.1 Required power amplifier output power to obtain a test level of 10 V.58 Table G.1 CDN level-setting process.65 Table G.2 CDN