DDR2一致性测试软件手顺.docx

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DDR2 Compliance test method

1. Purpose
To describe DDR2 Compliance test method

2. Test Apparatus
① Tektronix Company method
Test Apparatus
Type
Remark
Oscilloscope
MSO73304DX (Tektronix)

Differential probe
P7500 Series

Tips
Micro-coax Tip
It’s used to filter waveform
Test software
DDRA

② Agilent Company method
Test Apparatus
Type
Remark
Oscilloscope
DSOS404A (Agilent)

Differential probe
1132A

Tips
E2677A
It’s used to filter waveform
Test software
N5413B

3. Test Method
① Tektronix Company method
1) Power on Oscilloscope
2) Solder the tips on the test points and connect the tips into probes
3) Open the DDRA software
4) Select the DDR generation, data rate and the voltage levels (if required). There are different speed bins for each standard data rate for specific DDR generations.

5) Select the test items(Read/Write/Clock/Address)
6) Select channels for the test points(e.g. DQS for Channel 1 and DQ for Channel 2)
7) Setup Burst Detection Levels.
If your DDR2 design conforms to the design standard, default setup is enough.
8) Setup Thresholds and Scaling
9) If you have finished the above setup, Run the DDR2 Compliance test.
The true Eye pattern is shown as follows

② Agilent Company method
1) Power on Oscilloscope
2) Solder the tips on the test points and connect the tips into probes
3) To start the DDR2(+LP) Compliance Test Application: From the Infiniium oscilloscope’s main menu, choose Analyze>Automated Test Apps>DDR2(+LP) Test.

4) Create a new test project
Choose File>New Project... from the menu.
5) Set Up the Test Environment
Select the Test Mode and Data rate

6) Select the test you want to run

If tests have already been run, you will see their status in the Select Tests tab.
The marks have the following meanings:

7) Select either Compliance Mode or Debug Mode.
l Compliance Mode — lets you choose the configuration options necessary to meet the compliance standard tests.
l Debug Mode — lets you modify the configuration options. This can be useful, for example, when investigating a test failure.

8) Connecting the Oscilloscope to the DUT
Follow the displayed instructions for connecting the oscilloscope to the device under test.
It will show you we need connect which test points

When connections to the device under test have been made, check the I have completed these instructions box.
9) Start the test run.

Above the Tab, you can see 5 additional run options.
a) Store mode: you can select 4 types
l Best — stores the results of the best N trials.
l Event — stores the results of N trials in which the event is detected. The event is determined in the Event area. See Specify the event.
l Last — stores the results of the last N trials.
l Worst — stores the results of the worst N trials.

b) Run times: you can select 2 types
l 1 time
l N times(2~64)

c) To send email on pauses or stops
You can configure the test application to send email whenever a run pauses or ends.

d) To pause or stop on events
You can set up test runs to pause or stop on events which are checked at the end of each test.
l Pause — causes the run to pause when the event is detected.
l Stop — causes the run to stop when the event is detected.
e) Specify the event

l Fail — causes the event to fire when a prerequisite test or selected test fails.
l Margin < N — causes the event to fire when a test generates a margin < specified. When this option is selected, enter the minimum required margin percentage.
l Pass — causes the event to fire when a test passes (excluding prerequisite tests).

4. Attention
1) How to recognize read or write?
Read is edge aligned and write is center aligned.
With tip
Without tip
2) Be careful to solder the tips to the EUT. It’s more accurate to test waveform.

3) Don’t solder the tips to reverse polarity, then you will get wrong data.