石墨烯形貌&物相.pptx

单击此处编辑母版标题样式,单击此处编辑母版文本样式,第二级,第三级,第四级,第五级,2011/10/8,#,The characterization of grephene,班级：,09,级材料三班,组员：朱杉（编辑校稿）,张强（文章撰写）,高厚仁（资料收集）,陈宏翔（文章撰写）,开赛尔江（其他）,石墨烯的表征方法,1 Introduction,Graphene,a two-dimensional,single-layer sheet of,sp2-hybridized carbon atoms,has attracted tremendous attention and research interest,owing to its exceptional physical properties.,1.1 Synthesis of graphene,Mechanical exfoliation,Chemical vapor deposition(CVD),Chemically derived graphene,Other synthesis approaches,1.2 Properties and characterization,High electronic conductivity,Good thermal stability,Excellent mechanical strength,2 Morphology analysis,Atom Force Microscope,（,AFM,）,Scanning Tunnel Microscope,（,STM,）,Scanning Electron Microscope,（,SEM,）,Optical Microscope,（,OM,）,2.1 AFM,Preparation,Observation,Performance test,Fig1.SEM images of early attempts at mechanical exfoliation using graphite pillars,Fig2.,3D model of AFM tip/specimen contact,Fig3.Mechanical exfoliation produced the very first single layer graphene flakes.,Fig4,.(a)8 m x8 m AFM topography(b)Pseudo-3D representation,Fig5.Schematic of AFM tip/specimen contact under negative and positive appliedloads.,Fig6.,Fig7.AFM image of the graphene specimen,2D profiles at the six different regions and the thickness at the six sites indicated on the image,Fig8,.AFM images of graphene specimen(a)before and(b)after wear test.,Fig9.,(a)AFM image of wear tracks and(b)the cross-sections of wear tracks.,2 Morphology analysis,Atom Force Microscope,（,AFM,）,Scanning Tunnel Microscope,（,STM,）,Scanning Electron Microscope,（,SEM,）,Optical Microscope,（,OM,）,2.2 STM,Fig10.,(a)STM image of graphite showing only the three carbons that eclipse a neighbor in the sheet directly below.(b)In contrast,all six carbons are equivalent and thus visible in mechanically exfoliated single-layer graphene.,2 Morphology analysis,Atom Force Microscope,（,AFM,）,Scanning Tunnel Microscope,（,STM,）,Scanning Electron Microscope,（,SEM,）,Optical Microscope,（,OM,）,Fig11.,Graphene nanofabric.SEM micrograph of a strongly crumpled graphene sheet on a Si wafer.Note that it looks just like silk thrown over a surface.Lateral size of the image is 20 microns.Si wafer is at the bottom-right corner.,2.3 SEM,Fig12.(a)(b)SEM image of graphene,1 Morphology analysis,Atom Force Microscope,（,AFM,）,Scanning Tunnel Microscope,（,STM,）,Scanning Electron Microscope,（,SEM,）,Optical Microscope,（,OM,）,2.4 OM,Figure 13.,The interference pattern we calculate can be convertedinto RGB colors(a)and the comparison with the experimentally observed colors(b)is good.The red(c),green(d),and blue(e)components from the same image reproduce the main features of our numerical result in Figure 2b.While image(b)was not modified,in any way,contrast on panels c,d,and e was maximized for better visibility.(f)Large-scale atomic force scan for thickness reference.,Figure 14.Image of big graphite flake containing regions of many different thicknesses.A ultrathin graphite region(thickness below 2nm)is highlighted by a dashed rectangle.,(a)OM;(b)AFM;(c)SEM,Fig15.,Optical reflection and transmission schematic for a layered thin-film system consisting of a dielectric film(Al2O3,SiO2,or Si3N4)on silicon wafer(left part)and graphene added on the dielectric film(right part).,3 Phase analysis,X-Ray Diffraction,（,XRD,）,Transmission Electron Microscope,（,TEM,）,2.1 XRD,Fig17.XRD patterns of graphite(a),、,graphite,oxide(b)and graphene(c),Fig18.,XRD patterns of(a)before the CVD growth and(b)after the CVD growth of graphene multi-layers.Open circles:graphen multi-layers,open square:Fe,solid circles:Fe3C,3 Phase analysis,X-Ray Diffraction,（,XRD,）,Transmission Electron Microscope,（,TEM,）,Fig 19,(a)TEM images to show an example of a graphene.,Fig20.,The relative SAED pattern of the graphene sample,3.2 TEM,Fig21,a,b)High-resolution TEM images d,e)Electron diffraction patterns taken from the positions of the d)black and e)white,500nm,500nm,Fig 22,(a)TEM images and SAED pattern together to show an example of a graphene grain.,(b)Bright field TEM image of two coalesced grains and SAED.The SAED patterns have been filtered,Fig23.,TEM image and SAED pattern of the GNS film(a,b).TEM imageand SAED pattern of the a-CNP/GNS composite film(c,d),4 Conclusion,With new access to 2D crystallites,experimentalists scrambled to confirm results long predicted by theory.Before they could do so,techniques needed to be developed for the characterization of deposited flakes.,In light of such collaborations,it is difficult to believe that the future for graphene is anything but bright.,Thank you,.,