BS EN 60747-15-2004 半导体分立器件.孤立的电力半导体器件.pdf

BRITISH STANDARD BS EN 60747-15:2004 Discrete semiconductor devices Part 15: Isolated power semiconductor devices The European Standard EN 60747-15:2004 has the status of a British Standard ICS 31.080.99 ? BS EN 60747-15:2004 This British Standard was published under the authority of the Standards Policy and Strategy Committee on 8 March 2004 BSI 8 March 2004 ISBN 0 580 43522 9 National foreword This British Standard is the official English language version of EN 60747-15:2004. It is identical with IEC 60747-15:2003. The UK participation in its preparation was entrusted to Technical Committee EPL/47, Semiconductors, which has the responsibility to: A list of organizations represented on this committee can be obtained on request to its secretary. Cross-references The British Standards which implement international or European publications referred to in this document may be found in the BSI Catalogue under the section entitled “International Standards Correspondence Index”, or by using the “Search” facility of the BSI Electronic Catalogue or of British Standards Online. This publication does not purport to include all the necessary provisions of a contract. Users are responsible for its correct application. Compliance with a British Standard does not of itself confer immunity from legal obligations. aid enquirers to understand the text; present to the responsible international/European committee any enquiries on the interpretation, or proposals for change, and keep the UK interests informed; monitor related international and European developments and promulgate them in the UK. Summary of pages This document comprises a front cover, an inside front cover, the EN title page, pages 2 to 52, an inside back cover and a back cover. The BSI copyright notice displayed in this document indicates when the document was last issued. Amendments issued since publication Amd. No. DateComments 标准分享网 w w w .b z f x w .c o m 免费下载 w w w . b z f x w . c o m EUROPEAN STANDARD EN 60747-15 NORME EUROPENNE EUROPISCHE NORM January 2004 CENELEC European Committee for Electrotechnical Standardization Comit Europen de Normalisation Electrotechnique Europisches Komitee fr Elektrotechnische Normung Central Secretariat: rue de Stassart 35, B - 1050 Brussels 2004 CENELEC - All rights of exploitation in any form and by any means reserved worldwide for CENELEC members. Ref. No. EN 60747-15:2004 E ICS 31.080.99 English version Discrete semiconductor devices Part 15: Isolated power semiconductor devices (IEC 60747-15:2003) Dispositifs semiconducteurs Partie 15: Dispositifs semiconducteurs de puissance isols (CEI 60747-15:2003) Einzel-Halbleiterbauelemente Teil 15: Isolierte Leistungshalbleiter (IEC 60747-15:2003) This European Standard was approved by CENELEC on 2003-11-01. CENELEC members are bound to comply with the CEN/CENELEC Internal Regulations which stipulate the conditions for giving this European Standard the status of a national standard without any alteration. Up-to-date lists and bibliographical references concerning such national standards may be obtained on application to the Central Secretariat or to any CENELEC member. This European Standard exists in three official versions (English, French, German). A version in any other language made by translation under the responsibility of a CENELEC member into its own language and notified to the Central Secretariat has the same status as the official versions. CENELEC members are the national electrotechnical committees of Austria, Belgium, Czech Republic, Denmark, Estonia, Finland, France, Germany, Greece, Hungary, Iceland, Ireland, Italy, Latvia, Lithuania, Luxembourg, Malta, Netherlands, Norway, Poland, Portugal, Slovakia, Slovenia, Spain, Sweden, Switzerland and United Kingdom. w w w . b z f x w . c o m Foreword The text of the International Standard CEI 60747-15:2003, prepared by SC 47E, Discrete semiconductor devices, of CEI TC 47, Semiconductor devices, was submitted to the Unique Acceptance Procedure and was approved by CENELEC as EN 60747-15 on 2003-11-01 without any modification. The following dates were fixed: latest date by which the EN has to be implemented at national level by publication of an identical national standard or by endorsement (dop) 2004-11-01 latest date by which the national standards conflicting with the EN have to be withdrawn (dow) 2006-11-01 _ Endorsement notice The text of the International Standard CEI 60747-15:2003 was approved by CENELEC as a European Standard without any modification. In the official version, for Bibliography, the following notes have to be added for the standards indicated: IEC 60068-1 NOTE Harmonized as EN 60068-1:1994 (not modified). IEC 60068-2-1 NOTE Harmonized as EN 60068-2-1:1993 (not modified). IEC 60068-2-2 NOTE Harmonized as EN 60068-2-2:1993 (not modified). IEC 60068-2-58 NOTE Harmonized as EN 60068-2-58:1999 (not modified). IEC 60068-2-78 NOTE Harmonized as EN 60068-2-78:2001 (not modified). IEC 60112 NOTE Harmonized as EN 60112:2003 (not modified). IEC 60146-1-1 NOTE Harmonized as EN 60146-1-1:1993 (not modified). IEC 60146-2 NOTE Harmonized as EN 60146-2:2000 (not modified). IEC 60664-3 NOTE Harmonized as HD 625.3 S1:1997 (not modified). IEC 60747-5-1 NOTE Harmonized as EN 60747-5-1:2001 (not modified). IEC 60747-5-2 NOTE Harmonized as EN 60747-5-2:2001 (not modified). IEC 60747-5-3 NOTE Harmonized as EN 60747-5-3:2001 (not modified). IEC 60749-1 NOTE Harmonized as EN 60749-1:2003 (not modified). IEC 60749-2 NOTE Harmonized as EN 60749-2:2002 (not modified). IEC 60749-3 NOTE Harmonized as EN 60749-3:2002 (not modified). IEC 60749-4 NOTE Harmonized as EN 60749-4:2002 (not modified). IEC 60749-7 NOTE Harmonized as EN 60749-7:2002 (not modified). IEC 60749-9 NOTE Harmonized as EN 60749-9:2002 (not modified). IEC 60749-11 NOTE Harmonized as EN 60749-11:2002 (not modified). Page 2 EN 6074715:2004 标准分享网 w w w .b z f x w .c o m 免费下载 w w w . b z f x w . c o m IEC 60749-13 NOTE Harmonized as EN 60749-13:2002 (not modified). IEC 60749-16 NOTE Harmonized as EN 60749-16:2003 (not modified). IEC 60749-17 NOTE Harmonized as EN 60749-17:2003 (not modified). IEC 60749-18 NOTE Harmonized as EN 60749-18:2003 (not modified). IEC 60749-19 NOTE Harmonized as EN 60749-19:2003 (not modified). IEC 60749-29 NOTE Harmonized as EN 60749-29:2003 (not modified). IEC 60947-4-2 NOTE Harmonized as EN 60947-4-2:2000 (not modified). IEC 60947-4-3 NOTE Harmonized as EN 60947-4-3:2000 (not modified). IEC 60950-1 NOTE Harmonized as EN 60950-1:2001 (modified). IEC 61000 NOTE Harmonized in EN 61000 series (not modified). IEC 61340-5-1 NOTE Harmonized as EN 61340-5-1:2001 (not modified). IEC 61800-1 NOTE Harmonized as EN 61800-1:1998 (not modified). IEC 61800-2 NOTE Harmonized as EN 61800-2:1998 (not modified). _ Page 3 EN 6074715:2004 w w w . b z f x w . c o m CONTENTS 1 Scope.7 2 Normative references .7 3 Terms and definitions.9 4 Letter symbols.14 4.1 General.14 4.2 Additional subscripts/symbols.14 4.3 List letter symbols.14 4.3.1 Voltages and currents (see also IEC 60747-1).14 4.3.2 Mechanical terms.14 4.3.3 Other terms .15 5 Essential ratings (limiting values) and characteristics .15 5.1 General.15 5.1.1 Temperatures .15 5.1.2 Climatic characteristics.15 5.2 Ratings (limiting values).15 5.2.1 Isolation voltage, Visol.16 5.2.2 Peak case non-rupture current (where appropriate) .16 5.2.3 Maximum terminal current (ItRMS) (where appropriate) .16 5.2.4 Total power dissipation (Ptot).17 5.2.5 Minimum and maximum temperatures of isolated devices (Tstg, Tc, Tvj, Tsold) .17 5.2.6 Mechanically limiting ratings.17 5.3 Characteristics.18 5.3.1 Distances .18 5.3.2 Parasitic stray inductance (LP).18 5.3.3 Parasitic stray capacitance between switching circuit elements and case (CP).21 5.3.4 Partial discharge inception voltage (ViM or Vi(RMS) (where appropriate).21 5.3.5 Partial discharge extinction voltage (VeM or Ve(RMS) (where appropriate).21 5.3.6 Thermal resistances (Rth(.); Rth(j-c); Rth(c-s); Rth(j-s); Rth(j-a).21 5.3.7 Mechanical characteristics.25 5.3.8 Climatic characteristics.26 6 Verification of ratings (limiting values).26 6.1 Isolation voltage between terminals and base plate (Visol).26 6.2 Peak case non-rupture current .28 6.2.1 Peak case non-rupture current (IRSMC) of isolated diode and thyristor devices .28 6.2.2 Peak case non-rupture current (ICNR) of bipolar transistors, IGBTs and MOSFETs.28 6.3 Maximum terminal current (ItRMS).28 6.4 Surge (non-repetitive) current test (IFSM; ITSM) .28 7 Methods of measurement of characteristics.28 7.1 Rated partial discharge inception and extinction voltages (Vi ) (Ve).28 7.1.1 Rated partial discharge inception voltage (Vi).28 7.1.2 Rated partial discharge extinction voltage (Ve).28 7.2 Parasitic stray inductance between main terminals (LP).29 Page 4 EN 6074715:2004 标准分享网 w w w .b z f x w .c o m 免费下载 w w w . b z f x w . c o m 7.3 Parasitic stray capacitance of functional circuit elements to case (CP).32 7.4 Measuring methods for thermal characteristics.33 7.4.1 Thermal resistance junction to case (Rth(j-c).33 7.4.2 Thermal resistance case to heat sink Rth(c-s) (x) (per functional circuit element “x”).33 7.4.3 Thermal resistance junction to heat sink Rth(j-s) (for heat sink rated devices).34 7.5 Measuring methods of mechanical characteristics.34 7.5.1 Specified mounting torque (Ms) .34 7.5.2 Specified terminal torque (Mt).34 7.5.3 Mounting forces (F) .34 7.5.4 Pulling force (Ft).35 7.5.5 Flatness of base plate (ec).35 7.5.6 Roughness of base plate (RZc) .35 7.5.7 Mass (m) .35 8 Acceptance and reliability.35 8.1 General requirements.35 8.1.1 Failure-defining characteristics and failure criteria for acceptance tests .35 8.1.2 Procedure in case of a testing error.35 8.2 List of endurance tests .35 8.2.1 High temperature reverse bias (HTRB) .35 8.2.2 High humidity high temperature reverse bias (H3TRB).35 8.2.3 Power cycling (load) capability (Nf;p).35 8.2.4 High temperature storage (HTS).36 8.2.5 Low temperature storage (LTS) .36 8.2.6 Thermal cycling (TC) .